7N5A

Structure of AtAtm3 in the closed conformation


ELECTRON MICROSCOPY

Starting Model(s)

Initial Refinement Model(s)
TypeSourceAccession CodeDetails
experimental modelPDB 6PAR 

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d5.8069
f_angle_d0.5959
f_chiral_restr0.039
f_plane_restr0.0029
f_bond_d0.0025
Sample
AtAtm3 in MSP nanodiscs
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles140569
Reported Resolution (Å)3.95
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Point SymmetryC2
Map-Model Fitting and Refinement
Id1 (6PAR)
Refinement SpaceREAL
Refinement ProtocolRIGID BODY FIT
Refinement Target
Overall B Value119
Fitting Procedure
Details
Data Acquisition
Detector TypeFEI FALCON IV (4k x 4k)
Electron Dose (electrons/Å**2)48
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)1500
Maximum Defocus (nm)2100
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONcryoSPARC2.15
IMAGE ACQUISITIONEPU
CTF CORRECTIONcryoSPARC2.15
MODEL FITTINGPHENIX1.19
MODEL REFINEMENTPHENIX1.19
INITIAL EULER ASSIGNMENTcryoSPARC2.15
CLASSIFICATIONcryoSPARC2.15
RECONSTRUCTIONcryoSPARC2.15
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION4230125