6WWG
KIF14[391-772] dimer two-heads-bound state - ADP-AlFx in complex with a microtubule
ELECTRON MICROSCOPY
Sample |
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Kif14[391-772] - ADP-AlFx in complex with a microtubule |
Sample Components |
KIF14[391-772] - ADP-AlFx |
Microtubule |
Specimen Preparation | |
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Sample Aggregation State | FILAMENT |
Vitrification Instrument | FEI VITROBOT MARK IV |
Cryogen Name | ETHANE |
Sample Vitrification Details |
3D Reconstruction | |
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Reconstruction Method | HELICAL |
Number of Particles | 135651 |
Reported Resolution (Å) | 2.9 |
Resolution Method | FSC 0.143 CUT-OFF |
Other Details | 2 half datasets containing one distinct half of each filament were refined independently. |
Refinement Type | |
Symmetry Type | HELICAL |
Axial Symmetry | C1 |
Axial Rise | 5.44 |
Angular Rotation | 168.07 |
Map-Model Fitting and Refinement | |||||
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Id | 1 | ||||
Refinement Space | REAL | ||||
Refinement Protocol | FLEXIBLE FIT | ||||
Refinement Target | |||||
Overall B Value | |||||
Fitting Procedure | |||||
Details |
Data Acquisition | |||||||||
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Detector Type | GATAN K2 SUMMIT (4k x 4k) | ||||||||
Electron Dose (electrons/Å**2) | 75.13 |
Imaging Experiment | 1 |
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Date of Experiment | |
Temperature (Kelvin) | |
Microscope Model | FEI TITAN KRIOS |
Minimum Defocus (nm) | |
Maximum Defocus (nm) | |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | FEI TITAN KRIOS AUTOGRID HOLDER |
Nominal Magnification | 165000 |
Calibrated Magnification | 60533 |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 300 |
Imaging Details |
EM Software | ||
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Task | Software Package | Version |
IMAGE ACQUISITION | Leginon | beta |
CTF CORRECTION | RELION | 3.1 |
MODEL FITTING | RosettaEM | |
MODEL FITTING | PHENIX | |
MODEL FITTING | MODELLER | |
MODEL FITTING | UCSF Chimera | |
MODEL FITTING | Coot | 0.8.9 |
INITIAL EULER ASSIGNMENT | SPIDER | 22.10 |
FINAL EULER ASSIGNMENT | RELION | 3.1 |
RECONSTRUCTION | RELION | 3.1 |
Image Processing | ||||
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CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
PHASE FLIPPING AND AMPLITUDE CORRECTION | manual picking of filaments |