6QG3
Structure of eIF2B-eIF2 (phosphorylated at Ser51) complex (model B)
ELECTRON MICROSCOPY
Refinement
RMS Deviations | |
---|---|
Key | Refinement Restraint Deviation |
r_dihedral_angle_2_deg | 47.256 |
r_dihedral_angle_3_deg | 17.7 |
r_dihedral_angle_4_deg | 8.291 |
r_dihedral_angle_1_deg | 4.161 |
r_angle_refined_deg | 1.184 |
r_chiral_restr | 0.078 |
r_bond_refined_d | 0.007 |
r_gen_planes_refined | 0.004 |
r_bond_other_d | |
r_angle_other_deg |
Sample |
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Structure of eIF2B-eIF2 (phosphorylated at Ser51) complex (model B) |
Specimen Preparation | |
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Sample Aggregation State | PARTICLE |
Vitrification Instrument | FEI VITROBOT MARK I |
Cryogen Name | ETHANE |
Sample Vitrification Details |
3D Reconstruction | |
---|---|
Reconstruction Method | SINGLE PARTICLE |
Number of Particles | 32759 |
Reported Resolution (Å) | 9.4 |
Resolution Method | FSC 0.143 CUT-OFF |
Other Details | |
Refinement Type | |
Symmetry Type | POINT |
Point Symmetry | C1 |
Map-Model Fitting and Refinement | |||||
---|---|---|---|---|---|
Id | 1 (5B04, 6FYX) | ||||
Refinement Space | RECIPROCAL | ||||
Refinement Protocol | OTHER | ||||
Refinement Target | FSC | ||||
Overall B Value | |||||
Fitting Procedure | |||||
Details |
Data Acquisition | |||||||||
---|---|---|---|---|---|---|---|---|---|
Detector Type | FEI FALCON III (4k x 4k) | ||||||||
Electron Dose (electrons/Å**2) | 45 |
Imaging Experiment | 1 |
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Date of Experiment | |
Temperature (Kelvin) | |
Microscope Model | FEI TITAN KRIOS |
Minimum Defocus (nm) | 1500 |
Maximum Defocus (nm) | 3500 |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | 2.7 |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | FEI TITAN KRIOS AUTOGRID HOLDER |
Nominal Magnification | 59000 |
Calibrated Magnification | 104478 |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 300 |
Imaging Details |
EM Software | ||
---|---|---|
Task | Software Package | Version |
PARTICLE SELECTION | EMAN | |
IMAGE ACQUISITION | EPU | |
CTF CORRECTION | Gctf | |
MODEL FITTING | UCSF Chimera | 1.1 |
MODEL FITTING | Coot | 0.8 |
MODEL REFINEMENT | REFMAC | 5.8 |
INITIAL EULER ASSIGNMENT | RELION | 2 |
FINAL EULER ASSIGNMENT | RELION | 2 |
CLASSIFICATION | RELION | 2 |
RECONSTRUCTION | RELION | 2 |
Image Processing | ||||
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CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
PHASE FLIPPING AND AMPLITUDE CORRECTION | 633220 |