6BNO
Structure of bare actin filament
ELECTRON MICROSCOPY
Sample |
---|
bare actin filament |
Specimen Preparation | |
---|---|
Sample Aggregation State | FILAMENT |
Vitrification Instrument | LEICA EM GP |
Cryogen Name | ETHANE |
Sample Vitrification Details | Sample was applied to a glow-discharged holey carbon grid, incubated for 60 seconds and blotted for 3 seconds from the backside with filter paper. |
3D Reconstruction | |
---|---|
Reconstruction Method | HELICAL |
Number of Particles | 63139 |
Reported Resolution (Å) | 5.5 |
Resolution Method | FSC 0.143 CUT-OFF |
Other Details | |
Refinement Type | |
Symmetry Type | HELICAL |
Axial Symmetry | C1 |
Axial Rise | 28.11 |
Angular Rotation | -166.6 |
Map-Model Fitting and Refinement | |||||
---|---|---|---|---|---|
Id | 1 | ||||
Refinement Space | REAL | ||||
Refinement Protocol | FLEXIBLE FIT | ||||
Refinement Target | |||||
Overall B Value | 350 | ||||
Fitting Procedure | |||||
Details | Initial models were assembled from 8 actins (3J8A) through rigid body docking in Chimera, followed by flexible fitting with DireX. Resulting models w ... |
Data Acquisition | |||||||||
---|---|---|---|---|---|---|---|---|---|
Detector Type | GATAN K2 SUMMIT (4k x 4k) | ||||||||
Electron Dose (electrons/Å**2) | 1.5 |
Imaging Experiment | 1 |
---|---|
Date of Experiment | |
Temperature (Kelvin) | |
Microscope Model | FEI TECNAI 20 |
Minimum Defocus (nm) | 1500 |
Maximum Defocus (nm) | 3000 |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | 2 |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | GATAN 626 SINGLE TILT LIQUID NITROGEN CRYO TRANSFER HOLDER |
Nominal Magnification | 29000 |
Calibrated Magnification | |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 200 |
Imaging Details |
EM Software | ||
---|---|---|
Task | Software Package | Version |
PARTICLE SELECTION | Appion | |
IMAGE ACQUISITION | Leginon | |
CTF CORRECTION | CTFFIND | 3 |
CTF CORRECTION | FREALIGN | 9.11 |
MODEL FITTING | DireX | |
MODEL FITTING | MDFF | |
MODEL FITTING | NAMD | |
MODEL REFINEMENT | MDFF | |
INITIAL EULER ASSIGNMENT | EMAN2 | |
INITIAL EULER ASSIGNMENT | SPARX | |
FINAL EULER ASSIGNMENT | FREALIGN | 9.11 |
RECONSTRUCTION | FREALIGN | 9.11 |
Image Processing | ||||
---|---|---|---|---|
CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
PHASE FLIPPING AND AMPLITUDE CORRECTION |