5LW7
S. solfataricus ABCE1 post-splitting state
ELECTRON MICROSCOPY
Sample |
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S. solfataricus ABCE1 post-splitting state |
Specimen Preparation | |
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Sample Aggregation State | PARTICLE |
Vitrification Instrument | FEI VITROBOT MARK IV |
Cryogen Name | ETHANE |
Sample Vitrification Details |
3D Reconstruction | |
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Reconstruction Method | SINGLE PARTICLE |
Number of Particles | 19500 |
Reported Resolution (Å) | 17 |
Resolution Method | FSC 0.5 CUT-OFF |
Other Details | |
Refinement Type | |
Symmetry Type | POINT |
Map-Model Fitting and Refinement | |||||
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Id | 1 | ||||
Refinement Space | |||||
Refinement Protocol | RIGID BODY FIT | ||||
Refinement Target | |||||
Overall B Value | |||||
Fitting Procedure | |||||
Details |
Data Acquisition | |||||||||
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Detector Type | TVIPS TEMCAM-F816 (8k x 8k) | ||||||||
Electron Dose (electrons/Å**2) | 20 |
Imaging Experiment | 1 |
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Date of Experiment | |
Temperature (Kelvin) | |
Microscope Model | FEI TECNAI SPIRIT |
Minimum Defocus (nm) | |
Maximum Defocus (nm) | 35000 |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | 2.2 |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | |
Nominal Magnification | |
Calibrated Magnification | |
Source | OTHER |
Acceleration Voltage (kV) | 120 |
Imaging Details |
EM Software | ||
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Task | Software Package | Version |
PARTICLE SELECTION | Signature | |
IMAGE ACQUISITION | EM-Tools | |
CTF CORRECTION | CTFFIND | 4 |
MODEL FITTING | UCSF Chimera | |
MODEL REFINEMENT | Coot | |
INITIAL EULER ASSIGNMENT | SPIDER | 9.03 |
FINAL EULER ASSIGNMENT | SPIDER | 09.03 |
CLASSIFICATION | SPIDER | 09.03 |
RECONSTRUCTION | SPIDER | 09.03 |
Image Processing | ||||
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CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
NONE |