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MicroED structure of thermolysin at 2.5 A resolution
Starting Model(s) Initial Refinement Model(s) Type Source Accession Code Details experimental model PDB 2TLI
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 92.065 α = 90 b = 92.065 β = 90 c = 128.498 γ = 120
Symmetry Space Group P 61 2 2
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) Rpim I (All) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1 1.6 30.14 58.5 0.634 0.219 4 9 224846 25029
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) R Merge I (Observed) Rpim I (All) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 1.6 1.63 8 0.794 0.616 1.8 314
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Resolution (High) Resolution (Low) Cut-off Sigma (F) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Free (Depositor) Mean Isotropic B ELECTRON CRYSTALLOGRAPHY FREE R-VALUE 2.5 30.135 1.41 11327 589 96.96 0.291 0.2899 0.3096
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3]
RMS Deviations Key Refinement Restraint Deviation f_dihedral_angle_d 11.82 f_angle_d 0.509 f_chiral_restr 0.042 f_bond_d 0.003 f_plane_restr 0.003
Software Software Software Name Purpose PHENIX refinement
Specimen Preparation Sample Aggregation State 3D ARRAY Vitrification Instrument Cryogen Name ETHANE Sample Vitrification Details
3D Reconstruction Reconstruction Method CRYSTALLOGRAPHY Number of Particles Reported Resolution (Å) 2.5 Resolution Method DIFFRACTION PATTERN/LAYERLINES Other Details Refinement Type Symmetry Type 3D CRYSTAL Space Group Name Length a 90.75 Length b 90.75 Length c 90.75 Angle Alpha 120 Angle Beta 90 Angle Gamma 120
Map-Model Fitting and Refinement Id 1 (2TLI) Refinement Space RECIPROCAL Refinement Protocol OTHER Refinement Target Overall B Value Fitting Procedure Details
Data Acquisition Detector Type TVIPS TEMCAM-F416 (4k x 4k) Electron Dose (electrons/Å**2) 0.004
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model FEI TECNAI F20 Minimum Defocus (nm) Maximum Defocus (nm) Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode DIFFRACTION Specimen Holder Model Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 200 Imaging Details
EM Software Task Software Package Version IMAGE ACQUISITION EM-Menu 4.0.9.75 DIFFRACTION INDEXING iMosflm/MOSFLM 7.2.1 MODEL FITTING MOLREP 11.4.05 MODEL REFINEMENT PHENIX 1.10_2155 MOLECULAR REPLACEMENT MOLREP 11.4.05 SYMMETRY DETERMINATION POINTLESS 1.10.21 CRYSTALLOGRAPHY MERGING AIMLESS 0.5.25
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details NONE