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EM Structure of VP1A and VP1B
Refinement RMS Deviations Key Refinement Restraint Deviation f_dihedral_angle_d 12.199 f_angle_d 1.136 f_chiral_restr 0.06 f_bond_d 0.009 f_plane_restr 0.007
Specimen Preparation Sample Aggregation State PARTICLE Vitrification Instrument Cryogen Name NITROGEN Sample Vitrification Details
3D Reconstruction Reconstruction Method SINGLE PARTICLE Number of Particles 27000 Reported Resolution (Å) 3.3 Resolution Method FSC 0.143 CUT-OFF Other Details Refinement Type Symmetry Type POINT
Data Acquisition Detector Type FEI FALCON II (4k x 4k) Electron Dose (electrons/Å**2) 20
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model FEI TECNAI ARCTICA Minimum Defocus (nm) Maximum Defocus (nm) Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode BRIGHT FIELD Specimen Holder Model Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 200 Imaging Details
EM Software Task Software Package Version MODEL REFINEMENT PHENIX
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details PHASE FLIPPING AND AMPLITUDE CORRECTION