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Crystal Structure of Uncleaved ThnT T282C
Crystallization Crystalization Experiments ID Method pH Temperature Details 1 VAPOR DIFFUSION, SITTING DROP 7.5 298 12%PEG3350, 0.5M NaAcetate, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 298K 2 VAPOR DIFFUSION, SITTING DROP 7.5 298 12%PEG3350, 0.5M NaAcetate, 200uM EtHgPhosphate, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 140.534 α = 90 b = 68.651 β = 90 c = 73.761 γ = 90
Symmetry Space Group P 21 21 2
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1 x-ray 100 CCD RAYONIX MX-325 2009-05-30 M SINGLE WAVELENGTH 2 2 x-ray 100 CCD RAYONIX MX-325 2009-05-30 M MAD
Radiation Source ID # Source Type Wavelength List Synchrotron Site Beamline 1 SYNCHROTRON SSRL BEAMLINE BL12-2 0.80011,0.7336,1.00961 SSRL BL12-2 2 SYNCHROTRON SSRL BEAMLINE BL12-2 0.7336,1.00961 SSRL BL12-2
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1,2 1.6 50 94.5 0.058 9.9 6.8 89654
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) R Merge I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 1,2 1.6 1.65 68.3 0.664 3.7 5307
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Resolution (High) Resolution (Low) Cut-off Sigma (F) Number Reflections (All) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Work (DCC) R-Free (Depositor) R-Free (DCC) R-Free Selection Details Mean Isotropic B X-RAY DIFFRACTION MAD THROUGHOUT 1.6 39.54 1.3 94877 84968 4524 94.43 0.1595 0.1578 0.1726 0.1911 0.2024 RANDOM 24.417
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3] -0.66 0.73 -0.07
RMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 30.149 r_dihedral_angle_4_deg 20.621 r_dihedral_angle_3_deg 14.115 r_dihedral_angle_1_deg 6.57 r_scangle_it 5.201 r_scbond_it 3.434 r_mcangle_it 2.496 r_mcbond_it 1.584 r_angle_refined_deg 1.482 r_chiral_restr 0.13
RMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 30.149 r_dihedral_angle_4_deg 20.621 r_dihedral_angle_3_deg 14.115 r_dihedral_angle_1_deg 6.57 r_scangle_it 5.201 r_scbond_it 3.434 r_mcangle_it 2.496 r_mcbond_it 1.584 r_angle_refined_deg 1.482 r_chiral_restr 0.13 r_gen_planes_refined 0.016 r_bond_refined_d 0.014
Non-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 4992 Nucleic Acid Atoms Solvent Atoms 712 Heterogen Atoms
Software Software Software Name Purpose DENZO data reduction SCALEPACK data scaling SHELX phasing DM phasing REFMAC refinement PDB_EXTRACT data extraction HKL-2000 data collection HKL-2000 data reduction HKL-2000 data scaling SHELXD phasing