3KNW
Crystal structure of a putative transcriptional regulator (TetR/AcrR family member) from putative transcriptional regulator (TetR/AcrR family)
X-RAY DIFFRACTION
Crystallization
Crystalization Experiments | ||||
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ID | Method | pH | Temperature | Details |
1 | VAPOR DIFFUSION, SITTING DROP | 8.5 | 277 | 0.1 M TRIS, 20% PEG-1000, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 277K |
Crystal Properties | |
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Matthews coefficient | Solvent content |
2.52 | 51.23 |
Crystal Data
Unit Cell | |
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Length ( Å ) | Angle ( ˚ ) |
a = 62.741 | α = 90 |
b = 73.768 | β = 90 |
c = 106.921 | γ = 90 |
Symmetry | |
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Space Group | P 21 21 21 |
Diffraction
Diffraction Experiment | ||||||||||||||
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ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
1 | 1 | x-ray | 100 | CCD | ADSC QUANTUM 210r | mirrors | 2009-08-18 | M | SINGLE WAVELENGTH |
Radiation Source | |||||
---|---|---|---|---|---|
ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
1 | SYNCHROTRON | APS BEAMLINE 19-BM | 0.9794 | APS | 19-BM |
Data Collection
Overall | |||||||||||||||||||
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||||
1 | 2.45 | 30 | 98.9 | 0.088 | 23.5 | 5.3 | 19022 | 18816 | 2 | 2 | 65.8 |
Highest Resolution Shell | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | |||||||||||
1 | 2.45 | 2.49 | 96.4 | 0.52 | 2.8 | 4.1 | 908 |
Refinement
Statistics | |||||||||||||||||||
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Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Cut-off Sigma (I) | Cut-off Sigma (F) | Number Reflections (All) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (All) | R-Factor (Observed) | R-Work | R-Free | R-Free Selection Details | Mean Isotropic B | |||
X-RAY DIFFRACTION | SAD | THROUGHOUT | 2.45 | 30 | 2 | 2 | 17997 | 17687 | 961 | 98.92 | 0.213 | 0.21265 | 0.20992 | 0.26327 | RANDOM | 18.764 |
Temperature Factor Modeling | ||||||
---|---|---|---|---|---|---|
Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
-2.87 | -2.39 | 5.26 |
RMS Deviations | |
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Key | Refinement Restraint Deviation |
r_dihedral_angle_2_deg | 36.907 |
r_dihedral_angle_4_deg | 20.152 |
r_dihedral_angle_3_deg | 18.59 |
r_dihedral_angle_1_deg | 6.346 |
r_scangle_it | 3.56 |
r_scbond_it | 2.288 |
r_angle_refined_deg | 1.685 |
r_mcangle_it | 1.581 |
r_angle_other_deg | 0.992 |
r_mcbond_it | 0.864 |
Non-Hydrogen Atoms Used in Refinement | |
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Non-Hydrogen Atoms | Number |
Protein Atoms | 2834 |
Nucleic Acid Atoms | |
Solvent Atoms | 25 |
Heterogen Atoms | 4 |
Software
Software | |
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Software Name | Purpose |
SBC-Collect | data collection |
Auto-Rickshaw | phasing |
SHELX | model building |
CCP4 | model building |
MLPHARE | phasing |
NANtMRF | model building |
DM | model building |
RESOLVE | model building |
SHARP | phasing |
ARP/wARP | model building |
REFMAC | refinement |
HKL-3000 | data reduction |
HKL-3000 | data scaling |
SHELX | phasing |
CCP4 | phasing |
NANtMRF | phasing |
DM | phasing |
RESOLVE | phasing |