3DNY
Fitting of the eEF2 crystal structure into the cryo-EM density map of the eEF2.80S.AlF4-.GDP complex
ELECTRON MICROSCOPY
Starting Model(s)
Initial Refinement Model(s) | |||
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Type | Source | Accession Code | Details |
experimental model | PDB | 1N0U |
Sample |
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eEF2-bound 80S complex in presence of AlF4-, and GDP |
Specimen Preparation | |
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Sample Aggregation State | PARTICLE |
Vitrification Instrument | FEI VITROBOT MARK I |
Cryogen Name | ETHANE |
Sample Vitrification Details |
3D Reconstruction | |
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Reconstruction Method | SINGLE PARTICLE |
Number of Particles | |
Reported Resolution (Å) | 12.6 |
Resolution Method | |
Other Details | supervised classification was used (ref. Valle, M. et al, 2002, EMBO J.) |
Refinement Type | |
Symmetry Type | POINT |
Point Symmetry | C1 |
Map-Model Fitting and Refinement | |||||
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Id | 1 (1N0U) | ||||
Refinement Space | REAL | ||||
Refinement Protocol | RIGID BODY FIT | ||||
Refinement Target | |||||
Overall B Value | |||||
Fitting Procedure | |||||
Details | METHOD--Each domain fitted as rigid body, domains I (G and G), II,IV, and V were fitted. Domain III, and domain IV insertions were not included in th ... |
Data Acquisition | |||||||||
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Detector Type | KODAK SO-163 FILM | ||||||||
Electron Dose (electrons/Å**2) | 10 |
Imaging Experiment | 1 |
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Date of Experiment | |
Temperature (Kelvin) | 93 |
Microscope Model | FEI TECNAI F20 |
Minimum Defocus (nm) | 4500 |
Maximum Defocus (nm) | 1500 |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | |
Nominal Magnification | 50000 |
Calibrated Magnification | 49650 |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 200 |
Imaging Details |
EM Software | ||
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Task | Software Package | Version |
MODEL FITTING | O | |
RECONSTRUCTION | SPIDER |
Image Processing | ||||
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CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
segregation in defocus groups and correction in volumes |