☰ Navigation Tabs
Crystal structure of J-Trx1 fragment of ERdj5
Crystallization Crystalization Experiments ID Method pH Temperature Details 1 VAPOR DIFFUSION, SITTING DROP 7.5 293 13% PEG 4000, 6.5% ISOPROPANOL, 65MM HEPES PH7.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Crystal Properties Matthews coefficient Solvent content 2.07 40.45
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 54.008 α = 90 b = 61.179 β = 106.34 c = 62.912 γ = 90
Symmetry Space Group P 1 21 1
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1 x-ray 100 IMAGE PLATE DIP6040 MIRROR 2008-07-17 M SINGLE WAVELENGTH
Radiation Source ID # Source Type Wavelength List Synchrotron Site Beamline 1 SYNCHROTRON SPRING-8 BEAMLINE BL44XU 0.90 SPring-8 BL44XU
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1 1.84 39.56 99.6 0.064 15.3 3.8 33995 1 -3
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) R Merge I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 1.84 1.94 97.8 0.497 3.3 3.8
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Resolution (High) Resolution (Low) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Work (DCC) R-Free (Depositor) R-Free (DCC) R-Free Selection Details Mean Isotropic B X-RAY DIFFRACTION SAD THROUGHOUT 1.84 39.56 32251 1724 99.6 0.173 0.17 0.1712 0.23 0.2297 RANDOM 25
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3] 0.68 0.59 -0.56 0.2
RMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 34.127 r_dihedral_angle_3_deg 15.458 r_dihedral_angle_4_deg 15.457 r_dihedral_angle_1_deg 5.665 r_scangle_it 4.709 r_scbond_it 3.058 r_mcangle_it 1.739 r_angle_refined_deg 1.704 r_mcbond_it 0.984 r_chiral_restr 0.12
Show All KeysRMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 34.127 r_dihedral_angle_3_deg 15.458 r_dihedral_angle_4_deg 15.457 r_dihedral_angle_1_deg 5.665 r_scangle_it 4.709 r_scbond_it 3.058 r_mcangle_it 1.739 r_angle_refined_deg 1.704 r_mcbond_it 0.984 r_chiral_restr 0.12 r_bond_refined_d 0.019 r_gen_planes_refined 0.009
Hide All KeysNon-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 3317 Nucleic Acid Atoms Solvent Atoms 406 Heterogen Atoms
Software Software Software Name Purpose HKL-2000 data collection SHELX model building REFMAC refinement HKL-2000 data reduction SCALEPACK data scaling SHELX phasing