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STRUCTURE OF BACTERIORHODOPSIN AT 3.0 ANGSTROM BY ELECTRON CRYSTALLOGRAPHY
Crystallization Crystal Properties Matthews coefficient Solvent content 4.2 71
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 62.45 α = 90 b = 62.45 β = 90 c = 100 γ = 120
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Resolution (High) Resolution (Low) Cut-off Sigma (F) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Free (Depositor) R-Free Selection Details Mean Isotropic B ELECTRON CRYSTALLOGRAPHY THROUGHOUT 3 8 1 6107 358 73.7 0.237 0.237 0.33 RANDOM 14.2
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3]
RMS Deviations Key Refinement Restraint Deviation x_dihedral_angle_d 25.9 x_angle_deg 1.7 x_improper_angle_d 1 x_bond_d 0.013 x_bond_d_na x_bond_d_prot x_angle_d x_angle_d_na x_angle_d_prot x_angle_deg_na
RMS Deviations Key Refinement Restraint Deviation x_dihedral_angle_d 25.9 x_angle_deg 1.7 x_improper_angle_d 1 x_bond_d 0.013 x_bond_d_na x_bond_d_prot x_angle_d x_angle_d_na x_angle_d_prot x_angle_deg_na x_angle_deg_prot x_dihedral_angle_d_na x_dihedral_angle_d_prot x_improper_angle_d_na x_improper_angle_d_prot x_mcbond_it x_mcangle_it x_scbond_it x_scangle_it
Non-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 1721 Nucleic Acid Atoms Solvent Atoms 2 Heterogen Atoms 500
Software Software Software Name Purpose X-PLOR model building X-PLOR refinement X-PLOR phasing
Specimen Preparation Sample Aggregation State 2D ARRAY Embedding Material trehalose Embedding Details 3% (w/v) trehalose
3D Reconstruction Reconstruction Method CRYSTALLOGRAPHY Number of Particles Reported Resolution (Å) 3 Resolution Method DIFFRACTION PATTERN/LAYERLINES Other Details Refinement Type Symmetry Type
Data Acquisition Detector Type GENERIC GATAN KODAK SO-163 FILM Electron Dose (electrons/Å**2) 10 30
Imaging Experiment 1 2 Date of Experiment Temperature (Kelvin) Microscope Model JEOL 4000 JEOL 3000SFF Minimum Defocus (nm) Maximum Defocus (nm) Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode DIFFRACTION BRIGHT FIELD Specimen Holder Model Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN FIELD EMISSION GUN Acceleration Voltage (kV) Imaging Details
EM Software Task Software Package Version CRYSTALLOGRAPHY MERGING LATLINE CRYSTALLOGRAPHY MERGING CCP4 package OTHER MRC package MODEL FITTING O MODEL REFINEMENT X-PLOR