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CRYSTAL STRUCTURE OF A YEAST TBP/TATA-BOX COMPLEX
Crystallization Crystalization Experiments ID Method pH Temperature Details 1 VAPOR DIFFUSION, HANGING DROP 7.5 295 pH 7.50, VAPOR DIFFUSION, HANGING DROP, temperature 295.00K
Crystal Properties Matthews coefficient Solvent content 2.87 60
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 100.77 α = 90 b = 100.77 β = 90 c = 66.5 γ = 90
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1 x-ray AREA DETECTOR XENTRONICS M SINGLE WAVELENGTH
Radiation Source ID # Source Type Wavelength List Synchrotron Site Beamline 1 ROTATING ANODE RIGAKU
Refinement Statistics Diffraction ID Structure Solution Method Resolution (High) Resolution (Low) Cut-off Sigma (F) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Free (Depositor) Mean Isotropic B X-RAY DIFFRACTION 1.8 6 2 51009 86.7 0.201 0.201 0.261 35.1
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3]
RMS Deviations Key Refinement Restraint Deviation x_dihedral_angle_d 31.2 x_angle_deg 1.56 x_improper_angle_d 1.38 x_bond_d 0.015 x_bond_d_na x_bond_d_prot x_angle_d x_angle_d_na x_angle_d_prot x_angle_deg_na
RMS Deviations Key Refinement Restraint Deviation x_dihedral_angle_d 31.2 x_angle_deg 1.56 x_improper_angle_d 1.38 x_bond_d 0.015 x_bond_d_na x_bond_d_prot x_angle_d x_angle_d_na x_angle_d_prot x_angle_deg_na x_angle_deg_prot x_dihedral_angle_d_na x_dihedral_angle_d_prot x_improper_angle_d_na x_improper_angle_d_prot x_mcbond_it x_mcangle_it x_scbond_it x_scangle_it
Non-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 2832 Nucleic Acid Atoms 1194 Solvent Atoms 513 Heterogen Atoms
Software Software Software Name Purpose X-PLOR refinement